[{"name":"RP-161773","title":"Status report for WI UE Conformance Test Aspects \u2013 Further Enhancements of Minimization of Drive Tests for E-UTRAN; rapporteur: Intel","source":"RAN5","contact":"John M Meredith","contact-id":637,"tdoctype":"WI status report","for":"Discussion","abstract":"","secretary_remarks":"FLAG S","agenda_item_sort_order":157,"ainumber":"13.5.14","ainame":"UE Conformance Test Aspects \u2013 Further Enhancements of Minimization of Drive Tests for E-UTRAN [New WI: LTE_eMDT2-UEConTest]","tdoc_agenda_sort_order":177300,"status":"noted","reservation_date":"2016-09-12 19:01:14","uploaded":"2016-09-13 21:57:27","revisionof":"","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_eMDT2-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/TSG_RAN\/TSGR_73\/Docs\/RP-161773.zip","group":"RP","meeting":"RP-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]