[{"name":"R4-2014491","title":"Beam sweeping and test time reduction in FR2","source":"Fraunhofer HHI, Fraunhofer IIS","contact":"Mathis Schmieder","contact-id":77300,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":556,"ainumber":"13.1.6","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35260,"status":"noted","reservation_date":"2020-10-22 14:42:56","uploaded":"2020-10-23 08:32:40","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2014491.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2014726","title":"Discussion on FR2 test time reduction","source":"Samsung","contact":"Xutao Zhou","contact-id":40317,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":556,"ainumber":"13.1.6","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35270,"status":"noted","reservation_date":"2020-10-23 03:04:55","uploaded":"2020-10-23 08:55:25","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2014726.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]