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{"name":"R4-2014919","title":"TP to TR38.884 on High DL and Low UL power test cases","source":"Apple Inc.","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":551,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35050,"status":"revised","reservation_date":"2020-10-23 06:14:05","uploaded":"2020-10-23 22:48:32","revisionof":"","revisedto":"R4-2017598","release":"Rel-17","crspec":"38.884","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2014919.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2015319","title":"Test methodology for high DL power and low UL power test cases","source":"CAICT","contact":"Siting Zhu","contact-id":88691,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":551,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35070,"status":"noted","reservation_date":"2020-10-23 10:57:33","uploaded":"2020-11-16 17:51:13","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2015319.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2016213","title":"On Test methodology for high DL power and low UL power test cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":551,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35080,"status":"noted","reservation_date":"2020-10-23 16:24:06","uploaded":"2020-10-23 23:32:54","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2016213.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2016377","title":"Impact of phase variation","source":"MVG Industries, Sony","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During RAN4#e-96, a WF was agreed [1] for AI-enhanced test methods for NR FR2. Specifically, the simulation assumptions were agreed upon. The aim is to address the issue of UE beam management sensitivity to phase variation of the DL signal. Based on the a","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":551,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35090,"status":"noted","reservation_date":"2020-10-23 18:23:34","uploaded":"2020-10-23 18:27:47","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2016377.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2016562","title":"Views on test methods for high DL power and low UL power TCs","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":551,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35100,"status":"noted","reservation_date":"2020-10-23 22:58:03","uploaded":"2020-10-23 23:00:04","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2016562.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2017598","title":"TP to TR38.884 on High DL and Low UL power test cases","source":"Apple Inc., Keysight Technologies, Rohde & Schwarz, MVG Industries","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[97e][331] FR2_enhTestMethods","agenda_item_sort_order":551,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":35060,"status":"approved","reservation_date":"2020-11-16 16:35:56","uploaded":"2020-11-16 17:51:37","revisionof":"R4-2014919","revisedto":"","release":"Rel-17","crspec":"38.884","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_97_e\/Docs\/R4-2017598.zip","group":"R4","meeting":"R4-97-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]