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{"name":"R4-2010856","title":"Summary and Further Results on Impact of phase variation on beam pattern for NF test method","source":"MVG Industries, Sony","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During RAN4#93, a WF was agreed [1] for AI \u2013 enhanced test methods for NR FR2. Specifically, for Objective 1 (define test methodology for high DL power and low UL power test cases) a list of questions was developed to clarify the scope of potential enhanc","secretary_remarks":"","agenda_item_sort_order":480,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":28050,"status":"noted","reservation_date":"2020-08-07 12:28:50","uploaded":"2020-08-07 12:40:51","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_96_e\/Docs\/R4-2010856.zip","group":"R4","meeting":"R4-96-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2011218","title":"On Test methodology for high DL power and low UL power test cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"This contribution outlines our view on topic #1 (Test methodology for high DL power and low UL power test cases) of this SI [1].","secretary_remarks":"","agenda_item_sort_order":480,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":28060,"status":"noted","reservation_date":"2020-08-07 15:05:11","uploaded":"2020-08-07 22:55:51","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_96_e\/Docs\/R4-2011218.zip","group":"R4","meeting":"R4-96-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2011281","title":"Views on test methods for high DL power and low UL power TCs","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":480,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":28070,"status":"noted","reservation_date":"2020-08-07 15:53:08","uploaded":"2020-08-07 16:10:55","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.884","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_96_e\/Docs\/R4-2011281.zip","group":"R4","meeting":"R4-96-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2011456","title":"FR2 testability enhancement for UE emissions","source":"Qualcomm Incorporated","contact":"Sumant Iyer","contact-id":75048,"tdoctype":"other","for":"Discussion","abstract":"View on need to continue evolution of test methods for regulatory facing requirements","secretary_remarks":"","agenda_item_sort_order":480,"ainumber":"13.1.1","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":28080,"status":"noted","reservation_date":"2020-08-07 20:31:54","uploaded":"2020-08-07 23:37:32","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.101-2","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_96_e\/Docs\/R4-2011456.zip","group":"R4","meeting":"R4-96-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]