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{"name":"R4-2100245","title":"Test time reduction in OTA measurement","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Approval","abstract":"In this contribution we discuss a way to reduce test time of a beam peak search in FR2.","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36410,"status":"noted","reservation_date":"2021-01-14 01:15:10","uploaded":"2021-01-14 07:34:30","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100245.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100665","title":"Discussion on enhance test method to reduce FR2 OTA test time","source":"LG Electronics Inc.","contact":"Jin-yup Hwang","contact-id":47026,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36420,"status":"noted","reservation_date":"2021-01-14 23:52:28","uploaded":"2021-01-15 08:30:53","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100665.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100895","title":"Discussion on FR2 test time reduction","source":"Samsung","contact":"Xutao Zhou","contact-id":40317,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36430,"status":"noted","reservation_date":"2021-01-15 05:41:58","uploaded":"2021-01-15 10:25:16","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100895.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2101829","title":"Discussions on Test Time Reduction for NR FR2 RF","source":"vivo","contact":"Ruixin Wang","contact-id":88368,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36440,"status":"noted","reservation_date":"2021-01-15 13:23:53","uploaded":"2021-01-15 17:58:39","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2101829.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102088","title":"Discussion on test time reduction methods","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36450,"status":"noted","reservation_date":"2021-01-15 15:19:14","uploaded":"2021-01-15 18:06:21","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102088.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102401","title":"Analysis on reducing test time","source":"Huawei, HiSilicon","contact":"Ye Liu","contact-id":57639,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36460,"status":"noted","reservation_date":"2021-01-15 16:43:27","uploaded":"2021-01-15 19:24:08","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102401.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102618","title":"On Test Time Enhancements based on different Antenna Array Assumptions","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":600,"ainumber":"12.1.7","ainame":"Test time reduction [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36470,"status":"noted","reservation_date":"2021-01-15 18:27:16","uploaded":"2021-01-15 23:46:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102618.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]