[{"name":"R4-2100098","title":"DUT repositioning during ETC measurement in FR2","source":"Anritsu corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Approval","abstract":"In this contribution we discuss restrictions of DUT measurement procedure during the 3D scan under the extreme temperature condition (ETC). We also discuss some proposals which are related to a test time reduction.","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":598,"ainumber":"12.1.5","ainame":"Extreme temperature conditions [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36350,"status":"noted","reservation_date":"2021-01-13 06:27:37","uploaded":"2021-01-14 07:34:30","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100098.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100528","title":"Impact of ET on measurement uncertainty and test tolerance of spherical coverage EIRP and EIS","source":"Apple Inc.","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":598,"ainumber":"12.1.5","ainame":"Extreme temperature conditions [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36360,"status":"noted","reservation_date":"2021-01-14 12:16:05","uploaded":"2021-01-15 22:37:15","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100528.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2101828","title":"Discussions on FR2 Extreme temperature conditions","source":"vivo","contact":"Ruixin Wang","contact-id":88368,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":598,"ainumber":"12.1.5","ainame":"Extreme temperature conditions [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36370,"status":"noted","reservation_date":"2021-01-15 13:23:53","uploaded":"2021-01-15 17:58:39","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2101828.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102617","title":"On extreme temperature condition testing","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":598,"ainumber":"12.1.5","ainame":"Extreme temperature conditions [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36380,"status":"noted","reservation_date":"2021-01-15 18:27:16","uploaded":"2021-01-15 23:46:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102617.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102675","title":"FR2 testability in ETC","source":"Qualcomm Incorporated","contact":"Sumant Iyer","contact-id":75048,"tdoctype":"other","for":"Agreement","abstract":"We discuss TE requirements for ETC testing","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":598,"ainumber":"12.1.5","ainame":"Extreme temperature conditions [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36390,"status":"noted","reservation_date":"2021-01-15 18:49:28","uploaded":"2021-01-15 23:09:27","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102675.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]