[{"name":"R4-2100525","title":"TP to TR38.884 on High DL and Low UL power test cases","source":"Apple Inc.","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36150,"status":"merged","reservation_date":"2021-01-14 12:16:05","uploaded":"2021-01-15 23:50:43","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100525.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100526","title":"TP to TR38.884 on polarization mismatch","source":"Apple Inc.","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36200,"status":"merged","reservation_date":"2021-01-14 12:16:05","uploaded":"2021-01-15 23:51:49","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100526.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100571","title":"Views on solutions to minimize the impact of polarization basis mismatch","source":"Sony, Ericsson","contact":"Olof Zander","contact-id":82207,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36210,"status":"noted","reservation_date":"2021-01-14 17:58:48","uploaded":"2021-01-15 19:56:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100571.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100664","title":"Discussion on enhanced test method for polarization basis mismatch","source":"LG Electronics Inc.","contact":"Jin-yup Hwang","contact-id":47026,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36220,"status":"noted","reservation_date":"2021-01-14 23:51:45","uploaded":"2021-01-15 08:30:52","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100664.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100699","title":"Practical TPMI and 2-port CSI-RS for FR2 SISO test enhancement","source":"MediaTek Beijing Inc.","contact":"Ting-Wei Kang","contact-id":73295,"tdoctype":"discussion","for":"Approval","abstract":"Observation1: \u201cpractical TPMI\u201d is aligned with network\u2019s capability, and it can further enhance UE performance.\nProposal1: For \u201cTPMI method\u201d, \u201cpractical TPMI\u201d shall be further applied.\n\nObservation2: \u201c2-port CSI-RS\u201d is a feasible test method and aligned w","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36230,"status":"noted","reservation_date":"2021-01-15 01:20:12","uploaded":"2021-01-15 01:24:50","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100699.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2100894","title":"Discussion on FR2 EIRP measurement enhancement","source":"Samsung","contact":"Xutao Zhou","contact-id":40317,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36240,"status":"noted","reservation_date":"2021-01-15 05:41:58","uploaded":"2021-01-15 10:25:16","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2100894.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2101485","title":"Overview of the Impact of phase variation for Direct NF Method","source":"MVG Industries, Sony","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During RAN4#e-97, a WF was agreed [1] for enhanced test methods for NR FR2. Specifically, it was agreed on studying further DNF (direct NF). This contribution provides further simulation results for the DNF test method with the aim of comparing 4x1, 8x2 a","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36170,"status":"noted","reservation_date":"2021-01-15 12:16:08","uploaded":"2021-01-15 17:50:35","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2101485.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2101759","title":"Solution to minimize the impact of polarization basis mismatch","source":"OPPO","contact":"Jinqiang Xing","contact-id":76209,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36250,"status":"noted","reservation_date":"2021-01-15 13:07:39","uploaded":"2021-01-16 00:14:26","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2101759.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2101830","title":"TP to TR38.884 v0.1.0 on polarization basis mismatch","source":"vivo","contact":"Ruixin Wang","contact-id":88368,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36260,"status":"revised","reservation_date":"2021-01-15 13:23:53","uploaded":"2021-01-15 17:58:39","revisionof":"","revisedto":"R4-2103967","release":"Rel-17","crspec":"38.884","crspecversion":"0.1.0","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2101830.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102090","title":"Discussion on FR2 UL demodulation measurements","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36280,"status":"noted","reservation_date":"2021-01-15 15:19:14","uploaded":"2021-01-15 18:06:21","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102090.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102616","title":"On Test methodology for high DL power and low UL power test cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36180,"status":"noted","reservation_date":"2021-01-15 18:27:16","uploaded":"2021-01-15 23:46:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102616.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102620","title":"NF based solutions and Enhancement of permitted methods","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36190,"status":"noted","reservation_date":"2021-01-15 18:27:44","uploaded":"2021-01-15 19:34:40","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.884","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102620.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2102674","title":"FR2 testability enhancement for polarization mismatch","source":"Qualcomm Incorporated","contact":"Sumant Iyer","contact-id":75048,"tdoctype":"other","for":"Discussion","abstract":"We discuss test mode, 2 port CSIRS and enhancement 'coverage hole'","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36290,"status":"noted","reservation_date":"2021-01-15 18:49:28","uploaded":"2021-01-15 23:09:27","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2102674.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2103966","title":"TP to TR38.884 on High DL and Low UL power test cases","source":"Keysight, Rohde & Schwarz","contact":"Kai-Erik Sunell","contact-id":74524,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36160,"status":"approved","reservation_date":"2021-02-09 22:26:03","uploaded":"2021-02-09 22:31:12","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2103966.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2103967","title":"TP to TR38.884 v0.1.0 on polarization basis mismatch","source":"vivo","contact":"Ruixin Wang","contact-id":88368,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"[98e][330] FR2_enhTestMethods","agenda_item_sort_order":595,"ainumber":"12.1.2","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":36270,"status":"approved","reservation_date":"2021-02-09 22:26:03","uploaded":"2021-02-09 22:31:12","revisionof":"R4-2101830","revisedto":"","release":"Rel-17","crspec":"38.884","crspecversion":"0.1.0","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98_e\/Docs\/R4-2103967.zip","group":"R4","meeting":"R4-98-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]