[{"name":"R4-1609158","title":"Max output power test considerations","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":9158000,"status":"noted","reservation_date":"2016-11-02 06:49:07","uploaded":"2016-11-07 22:52:34","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609158.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609159","title":"REFSENS test considerations","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":9858000,"status":"noted","reservation_date":"2016-11-02 06:49:07","uploaded":"2016-11-07 22:52:34","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609159.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609160","title":"On test interface for NR UE","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":916200000,"status":"noted","reservation_date":"2016-11-02 06:49:07","uploaded":"2016-11-07 22:52:34","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609160.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609161","title":"Skeleton TR on NR UE testability","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":980900000,"status":"withdrawn","reservation_date":"2016-11-02 06:49:07","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609162","title":"Way Forward on NR UE testability","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"other","for":"Approval","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":981800000,"status":"revised","reservation_date":"2016-11-02 06:49:07","uploaded":"2016-11-19 17:47:25","revisionof":"","revisedto":"R4-1610926","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609162.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609598","title":"Overview of NR UE Test Proposals in NF and FF","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution provides an overview of different approaches suitable for NR UE testing as well as pros and cons of NF vs FF approaches","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":12800000,"status":"noted","reservation_date":"2016-11-03 18:59:54","uploaded":"2016-11-07 20:15:58","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609598.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609809","title":"Control Commands for NR UE Testability","source":"Anritsu Corporation","contact":"Takeshi Kobayashi","contact-id":66223,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":13100000,"status":"noted","reservation_date":"2016-11-04 06:27:40","uploaded":"2016-11-04 11:15:03","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609809.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609818","title":"Test setup for mmWave","source":"Qualcomm Incorporated","contact":"Valentin Gheorghiu","contact-id":43117,"tdoctype":"discussion","for":"Discussion","abstract":"In this paper we discuss the basic setup needed for mmWave RF measurements","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":51200000,"status":"noted","reservation_date":"2016-11-04 06:49:57","uploaded":"2016-11-04 22:35:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609818.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609858","title":"On TRP testing for UE emissions","source":"Ericsson","contact":"Torbjorn Elfstrom","contact-id":44796,"tdoctype":"discussion","for":"Discussion","abstract":"At last meeting (RAN4#80bis in Ljubljana) some practical issues regarding measuring UE OTA emission was discussed. This contribution will elaborate around possibilities and challenges related to measure UE OTA emission.","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":1000000,"status":"noted","reservation_date":"2016-11-04 08:05:19","uploaded":"2016-11-04 15:44:57","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609858.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1610010","title":"Link budget considerations for radiated modulation quality measurements","source":"ROHDE & SCHWARZ","contact":"Johannes Koebele","contact-id":49481,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution is focusing on the measurement link budget that is required for EUT (equipment under test) transmit signal quality measurements.","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":916100000,"status":"noted","reservation_date":"2016-11-04 12:53:47","uploaded":"2016-11-04 18:15:28","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1610010.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1610128","title":"Effect of Antenna Array Coupling at mmWaves","source":"MVG Industries, Sony Mobile","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"discussion","for":"Discussion","abstract":"During RAN4#80 \u2013bis, R4-168320 was discussed. It was mainly highlighted that in order to fulfil the FF criteria, 2D^2\/lambda, the dimension of the antenna array could have been used as D instead of the dimension of the device under test (DUT).\nThis contri","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":916000000,"status":"noted","reservation_date":"2016-11-04 13:09:56","uploaded":"2016-11-04 21:52:26","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1610128.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1610131","title":"5G NR Testability \u2013 Near Field Test Range","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"discussion","for":"Discussion","abstract":"During RAN4#80 \u2013bis, R4-168320 was discussed. This contribution highlighted pros and cons for the Far Field and Near Field test method and concluded that Far Field can be the only solution when it comes of 5G NR testability.  This contribution will addres","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":91590000,"status":"noted","reservation_date":"2016-11-04 13:17:29","uploaded":"2016-11-04 21:26:37","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1610131.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1610512","title":"TP on NR UE RF testability","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"other","for":"Approval","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":959800000,"status":"noted","reservation_date":"2016-11-07 17:08:28","uploaded":"2016-11-07 22:52:34","revisionof":"","revisedto":"R4-1610618","release":"Rel-14","crspec":"38.803","crspecversion":"14.1.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1610512.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1610618","title":"TP on NR UE RF testability","source":"Intel Corporation, CATR","contact":"Juha Korhonen","contact-id":21609,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":959800001,"status":"withdrawn","reservation_date":"2016-11-24 01:32:06","uploaded":null,"revisionof":"R4-1610512","revisedto":"","release":"Rel-14","crspec":"38.803","crspecversion":"14.1.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1610926","title":"Way Forward on NR UE testability","source":"Intel Corporation, CATR","contact":"Juha Korhonen","contact-id":21609,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"11.5.2.3","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":981800001,"status":"approved","reservation_date":"2016-11-18 23:00:00","uploaded":"2016-11-18 23:00:00","revisionof":"R4-1609162","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1610926.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]