[{"name":"R4-1704667","title":"On measurement uncertainty elements for UE RF test setup","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":461,"ainumber":"10.7.2.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":46670,"status":"noted","reservation_date":"2017-05-03 23:04:33","uploaded":"2017-05-06 13:17:51","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704667.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704739","title":"Discussion on Measurement Uncertainty Contributions of OTA Measurements for NR UE","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"Introduction of measurement uncertainty contributions of NR OTA measurements.","secretary_remarks":"","agenda_item_sort_order":461,"ainumber":"10.7.2.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":47390,"status":"noted","reservation_date":"2017-05-04 07:07:59","uploaded":"2017-05-05 05:25:13","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704739.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704767","title":"On MU for UE RF test setup","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":461,"ainumber":"10.7.2.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":47670,"status":"noted","reservation_date":"2017-05-04 08:49:50","uploaded":"2017-05-23 15:07:51","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704767.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705350","title":"Provisional measurement uncertainty values for UE RF baseline test method","source":"Keysight Technologies UK Ltd","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":461,"ainumber":"10.7.2.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":53500,"status":"noted","reservation_date":"2017-05-05 11:33:06","uploaded":"2017-05-06 19:31:50","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705350.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]