[{"name":"R4-1702941","title":"On measurement uncertainty elements for UE RF test setup","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":439,"ainumber":"10.6.2.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":29410,"status":"noted","reservation_date":"2017-03-23 15:08:21","uploaded":"2017-03-24 23:08:20","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702941.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]