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{"name":"R4-1702938","title":"Discussion of skeleton design of TR on test methods","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":29400,"status":"noted","reservation_date":"2017-03-23 15:08:21","uploaded":"2017-03-24 23:08:20","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702938.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1702939","title":"Skeleton TR on test methods","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"draft TR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":0,"status":"approved","reservation_date":"2017-03-23 15:08:21","uploaded":"2017-03-24 23:08:20","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"0.0.1","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702939.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1702940","title":"Introducing NR SI outcome to TR on test methods","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":33010,"status":"revised","reservation_date":"2017-03-23 15:08:21","uploaded":"2017-03-24 23:08:20","revisionof":"","revisedto":"R4-1704361","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702940.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703301","title":"Testability for 5G mmW UE","source":"LG Electronics Inc.","contact":"Suhwan Lim","contact-id":46654,"tdoctype":"other","for":"Discussion","abstract":"Provide test time for LTE conducted mode.\n3D OTA test point is quite huge compare to 4G LTE test. RAN4 should try to reduce test time and test point for 5G mmW UE","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":35681,"status":"noted","reservation_date":"2017-03-24 06:26:10","uploaded":"2017-03-24 17:46:02","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703301.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703568","title":"Overview of Compact Antenna Test Range (CATR) for 5G NR testability at mmWaves","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"discussion","for":"Information","abstract":"In 3GPP RAN4 #82, R4-1702089 was approved. This is a text proposal for addressing the FF criteria which is determined by the well-known equation 2D^2\/lambda where D is the maximum size of the device under test. At mmWave and for even smartphone, the FF di","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":439300,"status":"revised","reservation_date":"2017-03-24 13:22:20","uploaded":"2017-03-24 16:21:14","revisionof":"","revisedto":"R4-1704394","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703568.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704360","title":"Work plan for the study on test methods for New Radio","source":"Intel Corporation, CATR, Qualcomm, Mediatek","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":29390,"status":"approved","reservation_date":"2017-04-13 16:04:11","uploaded":"2017-04-13 16:07:25","revisionof":"R4-1702937","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704360.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704361","title":"Introducing NR SI outcome to TR on test methods","source":"Intel Corporation, CATR","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"draft TR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":0,"status":"approved","reservation_date":"2017-04-13 16:04:11","uploaded":"2017-04-13 16:07:25","revisionof":"R4-1702940","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"0.0.2","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704361.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704393","title":"SI on test methods for NR adhoc meeting notes","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"report","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":29370,"status":"approved","reservation_date":"2017-04-13 16:04:14","uploaded":"2017-04-13 16:07:25","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704393.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704394","title":"Overview of Compact Antenna Test Range (CATR) for 5G NR testability at mmWaves","source":"MVG Industries","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":439500,"status":"noted","reservation_date":"2017-04-13 16:04:14","uploaded":"2017-04-13 16:07:25","revisionof":"R4-1703568","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704394.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704396","title":"WF on framework and work plan for NR MU and test tolerance","source":"CATR, Intel Corporation, CMCC, Keysight, Huawei, Anritsu, Qualcomm, Samsung, Mediatek, PCTEST Engineering Lab","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":436,"ainumber":"10.6.1","ainame":"General [FS_NR_test_methods]","tdoc_agenda_sort_order":29371,"status":"approved","reservation_date":"2017-04-13 16:04:15","uploaded":"2017-04-13 16:07:25","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704396.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]