[{"name":"R4-167279","title":"Way forward on NR BS testability","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"other","for":"Approval","abstract":"---","secretary_remarks":"","agenda_item_sort_order":427,"ainumber":"10.5.3.3","ainame":"Testability[FS_NR_newRAT]","tdoc_agenda_sort_order":7279000,"status":"withdrawn","reservation_date":"2016-09-29 00:59:11","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-80","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-168306","title":"On NR BS conformance testing aspects","source":"Ericsson","contact":"Torbjorn Elfstrom","contact-id":44796,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution initiates the discussion on NR BS conformance testing.","secretary_remarks":"","agenda_item_sort_order":427,"ainumber":"10.5.3.3","ainame":"Testability[FS_NR_newRAT]","tdoc_agenda_sort_order":8306000,"status":"noted","reservation_date":"2016-09-30 07:10:40","uploaded":"2016-09-30 14:11:46","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_80Bis\/Docs\/R4-168306.zip","group":"R4","meeting":"R4-80","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]