[{"name":"R4-167212","title":"Conformance testing of beamforming characteristics","source":"ROHDE & SCHWARZ","contact":"Heinz Mellein","contact-id":6631,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"10.5.1.1","ainame":"Testability[FS_NR_newRAT]","tdoc_agenda_sort_order":7212000,"status":"noted","reservation_date":"2016-09-26 13:18:52","uploaded":"2016-09-29 06:40:42","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_80Bis\/Docs\/R4-167212.zip","group":"R4","meeting":"R4-80","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-168320","title":"UE Conformance Testing for mmWave","source":"Qualcomm Incorporated","contact":"Valentin Gheorghiu","contact-id":43117,"tdoctype":"other","for":"Discussion","abstract":"In this paper we discuss near field and far field testing.","secretary_remarks":"","agenda_item_sort_order":419,"ainumber":"10.5.1.1","ainame":"Testability[FS_NR_newRAT]","tdoc_agenda_sort_order":8320000,"status":"noted","reservation_date":"2016-09-30 08:20:19","uploaded":"2016-09-30 15:57:18","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_80Bis\/Docs\/R4-168320.zip","group":"R4","meeting":"R4-80","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]