[{"name":"R4-1911342","title":"Views on the applicability of NFTF and DNF methods in FR2","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution we show our views on necessary standpoints when studying applicability of NFTF\/DFN to FR2 test cases.","secretary_remarks":"","agenda_item_sort_order":705,"ainumber":"10.5.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":134200,"status":"noted","reservation_date":"2019-10-04 03:54:08","uploaded":"2019-10-04 07:24:02","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_92Bis\/Docs\/R4-1911342.zip","group":"R4","meeting":"R4-92","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1911502","title":"Views on the high DL power and low UL power objective","source":"Apple Inc.","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":705,"ainumber":"10.5.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":150200,"status":"noted","reservation_date":"2019-10-04 06:49:56","uploaded":"2019-10-04 23:53:20","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_92Bis\/Docs\/R4-1911502.zip","group":"R4","meeting":"R4-92","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1912106","title":"On Relaxation of Low UL and High DL Test Cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":705,"ainumber":"10.5.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":210600,"status":"noted","reservation_date":"2019-10-04 14:21:09","uploaded":"2019-10-04 22:28:03","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_92Bis\/Docs\/R4-1912106.zip","group":"R4","meeting":"R4-92","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]