[{"name":"R2-1800444","title":"Discussion on the assistance information for gap in EN-DC","source":"ZTE Corporation, Sanechips","contact":"Eswar Vutukuri","contact-id":74079,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":4440,"status":"revised","reservation_date":"2018-01-10 19:38:35","uploaded":"2018-01-11 22:15:37","revisionof":"","revisedto":"R2-1801510","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800444.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800482","title":"Measurement gap configuration in NR","source":"Huawei, HiSilicon","contact":"Nathan Tenny","contact-id":63312,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":6700,"status":"available","reservation_date":"2018-01-10 21:43:25","uploaded":"2018-01-12 04:10:26","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800482.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800625","title":"Measurement Gap Configuration for EN-DC","source":"Samsung","contact":"Pravjyot Singh Deogun","contact-id":64590,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":7270,"status":"available","reservation_date":"2018-01-11 06:47:26","uploaded":"2018-01-11 08:42:42","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800625.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800669","title":"Discussion on Remaining Issues on EN-DC Measurement Gap","source":"OPPO","contact":"Yang Ning","contact-id":62986,"tdoctype":"discussion","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":8110,"status":"available","reservation_date":"2018-01-11 08:22:54","uploaded":"2018-01-12 05:23:24","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800669.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800727","title":"Remaining issue on the measurement gap for ENDC","source":"Huawei, HiSilicon","contact":"Lei Liu","contact-id":59582,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":8170,"status":"available","reservation_date":"2018-01-11 09:03:03","uploaded":"2018-01-12 06:35:13","revisionof":"","revisedto":"R2-1802523","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800727.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800811","title":"Assistance Information for Measurement Gap","source":"CMCC","contact":"Ningyu Chen","contact-id":62843,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":12600,"status":"revised","reservation_date":"2018-01-11 10:29:30","uploaded":null,"revisionof":"","revisedto":"R2-1801260","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800817","title":"FFS discussion on measurement gap for EN-DC","source":"Nokia Shanghai Bell","contact":"Jing He","contact-id":73483,"tdoctype":"discussion","for":"","abstract":"=> Offline#40 (Nokia)","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":6250,"status":"available","reservation_date":"2018-01-11 10:39:45","uploaded":"2018-01-11 10:58:51","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800817.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800823","title":"GAP assistance information","source":"Spreadtrum Communications","contact":"Arto Lehti","contact-id":61519,"tdoctype":"draftCR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":8230,"status":"available","reservation_date":"2018-01-11 11:01:45","uploaded":"2018-01-11 14:06:33","revisionof":"","revisedto":"","release":"Rel-15","crspec":38.331,"crspecversion":"15.0.0","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800823.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800870","title":"Measurement gap assistance information","source":"vivo","contact":"LI CHEN","contact-id":70878,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":8700,"status":"available","reservation_date":"2018-01-11 11:44:41","uploaded":"2018-01-12 06:47:18","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800870.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800903","title":"Measurement gap handling in EN-DC","source":"Qualcomm Incorporated","contact":"Masato Kitazoe","contact-id":29801,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":9030,"status":"available","reservation_date":"2018-01-11 11:53:24","uploaded":"2018-01-12 07:23:41","revisionof":"","revisedto":"R2-1802604","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800903.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1800971","title":"Measurement Gap Design for EN-DC","source":"MediaTek Inc.","contact":"Chun-Fan Tsai","contact-id":73920,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":9710,"status":"available","reservation_date":"2018-01-11 12:24:31","uploaded":"2018-01-12 04:13:46","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1800971.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801011","title":"Measurement capability\/gap coordination","source":"Ericsson","contact":"Oumer Teyeb","contact-id":47021,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":10110,"status":"available","reservation_date":"2018-01-11 13:17:20","uploaded":"2018-01-12 01:30:56","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801011.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801012","title":"Measurement gap pattern in unsynchronized network","source":"Ericsson","contact":"Oumer Teyeb","contact-id":47021,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":10120,"status":"available","reservation_date":"2018-01-11 13:17:20","uploaded":"2018-01-12 01:30:56","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801012.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801169","title":"Draft LS to RAN4 on the need for additional MGL values in measurement gap pattern","source":"Ericsson","contact":"Oumer Teyeb","contact-id":47021,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":11690,"status":"available","reservation_date":"2018-01-11 21:09:21","uploaded":"2018-01-12 01:30:56","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"RAN4","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801169.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801260","title":"Assistance Information for Measurement Gap Configuration","source":"CMCC","contact":"Ningyu Chen","contact-id":62843,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":14260,"status":"available","reservation_date":"2018-01-12 01:37:56","uploaded":"2018-01-12 04:23:13","revisionof":"R2-1800811","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801260.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801426","title":"Measurement gap for EN-DC","source":"LG Electronics Inc.","contact":"Jaewook Lee","contact-id":56681,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":15100,"status":"available","reservation_date":"2018-01-12 05:16:13","uploaded":"2018-01-12 06:01:45","revisionof":"R2-1713821","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801426.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801510","title":"Discussion on the assistance information for gap in EN-DC","source":"ZTE Corporation, Sanechips","contact":"Eswar Vutukuri","contact-id":74079,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":4820,"status":"noted","reservation_date":"2018-01-12 07:19:11","uploaded":"2018-01-12 07:40:47","revisionof":"R2-1800444","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801510.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-1801657","title":"Summary for Offline discussion #40","source":"Nokai Shanghai Bell","contact":"Juha Korhonen","contact-id":21609,"tdoctype":"discussion","for":"Discussion","abstract":"=> Email#08","secretary_remarks":"","agenda_item_sort_order":81,"ainumber":"10.4.1.4.2","ainame":"Measurement gaps for EN-DC","tdoc_agenda_sort_order":6690,"status":"available","reservation_date":"2018-01-26 23:51:59","uploaded":"2018-01-26 23:51:59","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_AHs\/2018_01_NR\/Docs\/R2-1801657.zip","group":"R2","meeting":"R2-ah-18777","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]