[{"name":"R4-2407652","title":"On UE RF testability issue for Rel-19 LP-WUS","source":"Huawei, HiSilicon","contact":"Ye Liu","contact-id":57639,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":446,"ainumber":"10.14.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-11-05 07:39:58","uploaded":"2024-05-13 11:23:10","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_111\/Docs\/R4-2407652.zip","group":"R4","meeting":"R4-111","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2408050","title":"Testability aspects of LP-WUR","source":"Nokia Poland","contact":"alok Sethi","contact-id":98977,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":446,"ainumber":"10.14.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-05-13 06:16:14","uploaded":"2024-05-13 13:55:07","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_111\/Docs\/R4-2408050.zip","group":"R4","meeting":"R4-111","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2408111","title":"Discussions on LP-WUS Testability","source":"vivo","contact":"Ruixin Wang","contact-id":104883,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":446,"ainumber":"10.14.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-05-13 06:50:39","uploaded":"2024-05-13 15:00:10","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_111\/Docs\/R4-2408111.zip","group":"R4","meeting":"R4-111","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2408364","title":"Discussion on testability for LP-WUS UE RF requirements","source":"ZTE Corporation, Sanechips","contact":"Wubin Zhou","contact-id":43891,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":446,"ainumber":"10.14.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-05-13 08:06:46","uploaded":"2024-05-13 12:56:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_111\/Docs\/R4-2408364.zip","group":"R4","meeting":"R4-111","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2408826","title":"on LPWUS testability issue","source":"OPPO","contact":"Jinqiang Xing","contact-id":104933,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":446,"ainumber":"10.14.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-05-13 10:53:01","uploaded":"2024-05-13 11:02:58","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_111\/Docs\/R4-2408826.zip","group":"R4","meeting":"R4-111","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2409102","title":"On WUR RF requirement testability","source":"Ericsson","contact":"Chunhui Zhang","contact-id":78832,"tdoctype":"other","for":"Approval","abstract":"In this paper, we present our overview on the WUR RF requirement testability issue","secretary_remarks":"","agenda_item_sort_order":446,"ainumber":"10.14.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-05-13 11:49:30","uploaded":"2024-05-13 14:44:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_111\/Docs\/R4-2409102.zip","group":"R4","meeting":"R4-111","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]