[{"name":"R4-2112577","title":"Discussion on FR2 test time reduction","source":"Samsung","contact":"Bozhi Li","contact-id":81501,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[100-e][334] FR2_enhTestMethods_Part1","agenda_item_sort_order":676,"ainumber":"10.1.4","ainame":"Test time reduction","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 03:06:58","uploaded":"2021-08-06 09:22:28","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2112577.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2112987","title":"Further discussions on RSRP(B) based Rx beam peak search","source":"vivo","contact":"Ruixin Wang","contact-id":88368,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[100-e][334] FR2_enhTestMethods_Part1","agenda_item_sort_order":676,"ainumber":"10.1.4","ainame":"Test time reduction","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 08:32:39","uploaded":"2021-08-06 19:10:24","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.884","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2112987.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2114499","title":"On Non-Uniform TRP grids for PC1","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[100-e][334] FR2_enhTestMethods_Part1","agenda_item_sort_order":676,"ainumber":"10.1.4","ainame":"Test time reduction","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2021-08-06 18:52:35","uploaded":"2021-08-06 23:47:17","revisionof":"","revisedto":"R4-2115763","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2114499.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2114541","title":"Spectrum emission mask test time reduction","source":"Huawei, HiSilicon","contact":"Qian Zhang","contact-id":73473,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[100-e][334] FR2_enhTestMethods_Part1","agenda_item_sort_order":676,"ainumber":"10.1.4","ainame":"Test time reduction","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 19:50:42","uploaded":"2021-08-06 20:05:55","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2114541.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2115763","title":"On Non-Uniform TRP grids for PC1","source":"Keysight Technologies UK Ltd","contact":"Carolyn Taylor","contact-id":90657,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[100-e][334] FR2_enhTestMethods_Part1","agenda_item_sort_order":676,"ainumber":"10.1.4","ainame":"Test time reduction","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-07 03:45:55","uploaded":"2021-08-26 19:31:16","revisionof":"R4-2114499","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2115763.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]